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  4. Extensive microstructural quality control inside a machine tool using multiwavelength digital holography
 
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2018
Conference Paper
Title

Extensive microstructural quality control inside a machine tool using multiwavelength digital holography

Abstract
With state-of-the-art 3D measurement systems, short-wave structures such as tool marks cannot be resolved directly inside a machine tool chamber. Up to now, measurements had to be performed outside the machine tool. We present an interferometric sensor that carries out such measurements inside the machine tool, which saves time-consuming and expensive setup procedures. Our sensor HoloCut uses digital holography as measurement principle. By the use of multiple wavelengths, we get a large unambiguous axial measurement range of up to 2 mm and achieve micron repeatability, even in the presence of laser speckles. With a lateral resolution of 7 mm across the entire 20 x 20 mm2 field of view, both macro- and microstructures (such as tool marks) are measured with an axial resolution of 1 mm. Consequently, this qualifies HoloCut for in-situ measurements and integration in a machine tool. In this paper, the boundary conditions of integrating interferometers inside a machine tool are evaluated. Occurring vibrations and limited available space are particularly challenging constraints: The optical and mechanical design of HoloCut is introduced along with numerical correction algorithms: A piezo-stage setup is used to induce known displacements. Using these algorithms, measurements even with a closed-loop control of the machine tool head activated are demonstrated on a coin measurement. The use of HoloCut is motivated on the base of the daily operation of a 5-axis machine tool: We present an evaluation of an exemplary ISO 25178 parameter Sq using HoloCut measurements and compare those with reference, yet not inline-capable systems.
Author(s)
Seyler, Tobias  
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Fratz, Markus  
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Beckmann, Tobias
Bertz, Alexander  
Carl, Daniel  
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Grün, Viktor
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Börret, Rainer
Ströer, Felix
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Seewig, Jörg
Mainwork
Speckle 2018, VII International Conference on Speckle Metrology  
Conference
International Conference on Speckle Metrology (SPECKLE) 2018  
Open Access
File(s)
Download (1.62 MB)
Rights
Under Copyright
DOI
10.24406/publica-r-401816
10.1117/12.2319750
Language
English
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Keyword(s)
  • multiwavelength holography

  • inline measurement

  • quality control

  • machine tool

  • 3D surface parameter

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