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  4. ESD robustness of IoT devices: Are we going to face new challenges?
 
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2018
Presentation
Title

ESD robustness of IoT devices: Are we going to face new challenges?

Title Supplement
Presentation held at EOS/ESD Symposium, Workshop on Robustness of IoT Devices, September 26-27, 2018, Reno, NV
Abstract
The Internet of Things (IoT) is a rapidly growing market. Depending on the application the environmental conditions can be completely different for IoT devices. Furthermore, the growing complexity of these devices increase also the susceptibility concerning hardware or software related failures. This presentation will discuss real world examples which required more than the standard qualification tests in order to reveal and fix weaknesses in the design.
Author(s)
Wolf, Heinrich  
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Conference
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) 2018  
Workshop on Robustness of IoT Devices 2018  
File(s)
Download (2.07 MB)
Rights
Use according to copyright law
DOI
10.24406/publica-fhg-401802
Language
English
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Keyword(s)
  • ESD

  • robustness

  • IoT device

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