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  4. Dynamic fault injection for system level simulation of MEMS - a design method for functional safety
 
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2018
Conference Paper
Title

Dynamic fault injection for system level simulation of MEMS - a design method for functional safety

Abstract
In this paper a method for dynamic fault injection and fault simulation as well as its application to MEMS based sensor systems is described. The prerequisite for this approach is the avail-ability of accurate, but likewise numerically efficient models for the MEMS element. Simulations based on SystemC and SystemC AMS are suitable to analyze the nominal behavior of complex systems including electronics and the mechanical behavior of the MEMS elements [1], [2]. They offer capabilities to represent analog and digital hardware as well as software and nonelectrical components in one simulation environment. Especially for the modelling of mechanical structures, dedicated modelling algorithms like model order reduction [3], [4] have to be applied to ensure high numerical efficiency.
Author(s)
Blochmann, Tino
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Schneider, Peter  
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Markwirth, Thomas  orcid-logo
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Gerth, Stephan
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Jancke, Roland  
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Mainwork
Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS, DTIP 2018  
Project(s)
RoMulus
Funder
Bundesministerium für Bildung und Forschung BMBF (Deutschland)  
Conference
Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP) 2018  
Open Access
File(s)
Download (705.11 KB)
Rights
Use according to copyright law
DOI
10.24406/publica-r-400737
10.1109/DTIP.2018.8394196
Language
English
Fraunhofer-Institut für Integrierte Schaltungen IIS  
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