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  4. Correlation study of different CDM testers and CC-TLP
 
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2017
Conference Paper
Title

Correlation study of different CDM testers and CC-TLP

Abstract
This paper analyzes the correlation between test results of three different CDM testers and corresponding results of Capacitively Coupled Transmission Line Pulsing (CC-TLP). Furthermore, it discusses the significance of the current slew rate as an additional failure threshold and the reasons for a poor reproducibility of CDM failures.
Author(s)
Weber, Johannes  
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Kaschani, Karim T.
Texas Instruments
Gieser, Horst  
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Wolf, Heinrich  
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Maurer, Linus  
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Famulok, Nicolai
Texas Instruments
Moser, Reinhard
Texas Instruments
Rajagopal, Krishna
Texas Instruments
Sellmayer, Michael
Texas Instruments
Sharma, Anmol
Texas Instruments
Tamm, Heiko
Texas Instruments
Mainwork
39th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2017. Proceedings  
Conference
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) 2017  
DOI
10.23919/EOSESD.2017.8073446
Language
English
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
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