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  4. Correlation study of different CDM testers and CC-TLP
 
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2017
Konferenzbeitrag
Titel

Correlation study of different CDM testers and CC-TLP

Abstract
This paper analyzes the correlation between test results of three different CDM testers and corresponding results of Capacitively Coupled Transmission Line Pulsing (CC-TLP). Furthermore, it discusses the significance of the current slew rate as an additional failure threshold and the reasons for a poor reproducibility of CDM failures.
Author(s)
Weber, Johannes
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT
Kaschani, Karim T.
Texas Instruments
Gieser, Horst
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT
Wolf, Heinrich
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT
Maurer, Linus
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT
Famulok, Nicolai
Texas Instruments
Moser, Reinhard
Texas Instruments
Rajagopal, Krishna
Texas Instruments
Sellmayer, Michael
Texas Instruments
Sharma, Anmol
Texas Instruments
Tamm, Heiko
Texas Instruments
Hauptwerk
39th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2017. Proceedings
Konferenz
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) 2017
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DOI
10.23919/EOSESD.2017.8073446
Language
Englisch
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