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  4. Experimental verification of a self-triggered solid-state circuit breaker based on a SiC BIFET
 
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2017
Conference Paper
Title

Experimental verification of a self-triggered solid-state circuit breaker based on a SiC BIFET

Abstract
In this work, the feasibility of the Bipolar-Injection Field Effect-Transistor (BIFET) [5] in two different Dual Thyristor type circuits [4] for an application as solid-state circuit breaker (SSCB) is experimentally verified. The Dual Thyristor type circuits are assembled from discrete silicon JFETs and a silicon carbide BIFET and are electrically characterized at various temperatures. The current-voltage characteristic shows the expected regenerative self-triggered turn-off capability under over-currents and the option to control the turn-off current by a passive resistor network. The issue with the adverse positive temperature coefficient of the trigger-current can be solved by putting the SiC BIFET in a cascode arrangement with a silicon Dual Thyristor. In this configuration the SiC BIFET provides the high voltage blocking capability and the silicon Dual Thyristor with its negative temperature coefficient controls the trigger-current. Transient analyses of both circuits indicate fast switching times of less than 50 ms seconds. It is demonstrated for the first time, that the SiC BIFET, due to its normally-on behaviour, used in a Dual Thyristor type circuit is a promising concept for self-triggered fuses in high current and high voltage applications.
Author(s)
Albrecht, M.
Hürner, A.
Erlbacher, T.  
Bauer, A.J.
Frey, L.
Mainwork
Silicon carbide and related materials 2016  
Conference
European Conference on Silicon Carbide and Related Materials (ECSCRM) 2016  
DOI
10.4028/www.scientific.net/MSF.897.665
Language
English
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
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