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  4. Miniaturized multiwavelength digital holography sensor for extensive in-machine tool measurement
 
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2017
Conference Paper
Title

Miniaturized multiwavelength digital holography sensor for extensive in-machine tool measurement

Abstract
In this paper we present a miniaturized digital holographic sensor (HoloCut) for operation inside a machine tool. With state-of-the-art 3D measurement systems, short-range structures such as tool marks cannot be resolved inside a machine tool chamber. Up to now, measurements had to be conducted outside the machine tool and thus processing data are generated offline. The sensor presented here uses digital multiwavelength holography to get 3D-shape-information of the machined sample. By using three wavelengths, we get a large artificial wavelength with a large unambiguous measurement range of 0.5mm and achieve micron repeatability even in the presence of laser speckles on rough surfaces. In addition, a digital refocusing algorithm based on phase noise is implemented to extend the measurement range beyond the limits of the artificial wavelength and geometrical depth-of-focus. With complex wave field propagation, the focus plane can be shifted after the camera images have been taken and a sharp image with extended depth of focus is constructed consequently. With 20mm x 20mm field of view the sensor enables measurement of both macro- and micro-structure (such as tool marks) with an axial resolution of 1 µm, lateral resolution of 7 µm and consequently allows processing data to be generated online which in turn qualifies it as a machine tool control. To make HoloCut compact enough for operation inside a machining center, the beams are arranged in two planes: The beams are split into reference beam and object beam in the bottom plane and combined onto the camera in the top plane later on. Using a mechanical standard interface according to DIN 69893 and having a very compact size of 235mm x 140mm x 215mm (WxHxD) and a weight of 7.5 kg, HoloCut can be easily integrated into different machine tools and extends no more in height than a typical processing tool.
Author(s)
Seyler, Tobias  
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Fratz, Markus  
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Beckmann, Tobias
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Bertz, Alexander  
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Carl, Daniel  
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Mainwork
Optical Measurement Systems for Industrial Inspection X  
Conference
Conference "Optical Measurement Systems for Industrial Inspection" 2017  
Open Access
File(s)
Download (31.13 MB)
DOI
10.1117/12.2270087
10.24406/publica-r-397388
Language
English
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Keyword(s)
  • multi-wavelength holography

  • inline measurement

  • quality control

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