• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Konferenzschrift
  4. Novel processing scheme for embedding and interconnection of ultra-thin IC devices in flexible chip foil packages and recurrent bending reliability analysis
 
  • Details
  • Full
Options
2016
Conference Paper
Title

Novel processing scheme for embedding and interconnection of ultra-thin IC devices in flexible chip foil packages and recurrent bending reliability analysis

Abstract
We present technological results on the embedding of ultra-thin microcontroller ICs in flexible film substrates. The novel concept is based on the following technologies: face-up chip mounting in cavities on film laminates, photo-lithographic patterning of vias and interconnects embedding in polymer layer and compatibility with both sheet and roll-to-roll processing. The paper briefly reviews the benefit of embedding for ultra-thin dies in terms of mechanical robustness. For the technological demonstration, we used 25mm thin microcontroller IC and 50mm polyimide film substrates. Electrical interconnections were realized by sputtering of metal layers. Photolithography was performed on ""wafer level"" using aligner photomasks and a photo-sensitive polymer of 10mm thickness for embedding. The embedding process resulted in a mechanically flexible fan-out chip package of a thickness below 100mm. Perspectives and technological requirements for roll-to-roll manufacture as well as cost estimation for this kind of Thin Chip Foil Package are explained and discussed. Furthermore, we report our recent work on the development of an in-situ bending and electrical test equipment for flexible film modules. The new set-up was evaluated using ultra-thin test chips with daisy chain patterns that were ACA flip-chip bonded onto Polyimide films. It was found that reducing the chip thickness from 28mm to 12mm lead to a strong increase in mechanical strength of the chip-on-film (COF) assemblies tested under recurrent bending.
Author(s)
Landesberger, C.
Palavesam, N.
Hell, W.
Drost, A.
Faul, R.
Gieser, H.
Bonfert, D.
Bock, K.
Kutter, C.
Mainwork
International Conference on Electronics Packaging, ICEP 2016  
Conference
International Conference on Electronics Packaging (ICEP) 2016  
DOI
10.1109/ICEP.2016.7486872
Language
English
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024