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  4. Best practice approaches for stress measurements on thin layer stacks
 
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2016
Conference Paper
Title

Best practice approaches for stress measurements on thin layer stacks

Abstract
As illustrated for single cases, the residual stress analysis based on FIB milling and DIC analysis has a large potential to determine residual stresses in thin layer systems. For the introduction of the FIB-DIC approach as industrial method, measurement automation with time saving fast measurement routines, cost efficient and validated measurement procedures are a basic prerequisite. A best practice report under preparation (in [6]) will give the industrial user guidance to implement and use the FIBDIC method with own equipment. Besides instructions to get started fast, a wide experience in applying the FIB-DIC method will be presented. It allows preparation of suitable measurement routines for customer specific problems, avoiding elaborate trial-and-error tests.
Author(s)
Auerswald, E.
Vogel, D.
Sebastiani, M.
Lord, J.
Rzepka, Sven  
Mainwork
Smart Systems Integration 2016. Proceedings  
Conference
Smart Systems Integration Conference (SSI) 2016  
International Conference and Exhibition on Integration Issues of Miniaturized Systems 2016  
Language
English
Fraunhofer-Institut für Elektronische Nanosysteme ENAS  
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