2016
Poster
Title

Systematic characterization of doping profiles in 4H-SiC by point contact current voltage measurements

Title Supplement
Poster presented at 11th European Conference on Silicon Carbide & Related Materials, September 25th - 29th, 2016, Halkidiki, Greece
Author(s)
Kocher, Matthias  
Niebauer, Michael
Rommel, Mathias  orcid-logo
Haeublein, Volker  
Bauer, Anton
Conference
File(s)
Rights
Use according to copyright law
DOI
Language
English
Keyword(s)