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2016
Presentation
Title

Test System Architectures using Advanced Standardized Test Languages

Title Supplement
Presentation held at 3rd International Workshop on Software Test Architecture (InSTA 2016), 10. April 2016, Chicago
Abstract
The development of test suites using standardized test languages like TTCN-3 and UTP starts with an analysis of the external interfaces towards the system under test (SUT). Large and complex SUTs often require a distributed test system architecture that have to consider the test objectives and the introduction of multiple parallel test system components. The decomposition of a test system needs to be discussed and decided at the very beginning of the test development process. This presentation introduces different approaches from industrial test suite development projects and provides experiences with abstract test system architecture issues (e.g. synchronization, logging and maintenance).
Author(s)
Rennoch, Axel  orcid-logo
Conference
International Workshop on Software Test Architecture (InSTA) 2016  
DOI
10.24406/publica-fhg-392075
File(s)
N-393943.pdf (2.3 MB)
Rights
Under Copyright
Language
English
Fraunhofer-Institut für Offene Kommunikationssysteme FOKUS  
Keyword(s)
  • TTCN-3

  • UTP

  • TDL

  • Test architecture

  • Test automation

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