Options
2015
Presentation
Title
Imaging defect luminescence measurements of 4H-SiC by UV-PL
Title Supplement
Presentation held at DKT 2015, March 4-6, 2015, Frankfurt a. Main
Other Title
Abbildende Defektlumineszenz an 4H-SiC durch ultraviolette Photolumineszenz
Author(s)
Conference