Options
2014
Conference Paper
Title
Deep energy levels of platinum-hydrogen complexes in silicon
Other Title
Tiefe Störstellen von Platin-Wasserstoff-Komplexen in Silicium
Abstract
Hydrogen incorporated into the samples by wet chemical etching interacts with platinum and forms several energy levels in the silicon forbidden band gap. Deep-level transient spectroscopy (DLTS) on Schottky diodes reveals several platinum-hydrogen related levels in p- and n-type silicon. In the n-type silicon, two new platinum-hydrogen related levels at 0.28 and 0.41 eV below the conduction band are reported. Annealing at 377 °C results in the dissociation of their corresponding platinum-hydrogen complexes.
Author(s)