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  4. Deep energy levels of platinum-hydrogen complexes in silicon
 
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2014
Conference Paper
Title

Deep energy levels of platinum-hydrogen complexes in silicon

Other Title
Tiefe Störstellen von Platin-Wasserstoff-Komplexen in Silicium
Abstract
Hydrogen incorporated into the samples by wet chemical etching interacts with platinum and forms several energy levels in the silicon forbidden band gap. Deep-level transient spectroscopy (DLTS) on Schottky diodes reveals several platinum-hydrogen related levels in p- and n-type silicon. In the n-type silicon, two new platinum-hydrogen related levels at 0.28 and 0.41 eV below the conduction band are reported. Annealing at 377 °C results in the dissociation of their corresponding platinum-hydrogen complexes.
Author(s)
Badr, Elie
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Pichler, Peter  orcid-logo
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Schmidt, Gerhard
Infineon Technologies Austria AG
Mainwork
Gettering and Defect Engineering in Semiconductor Technology XV, GADEST 2013  
Conference
International Conference on Gettering and Defect Engineering in Semiconductor Technology (GADEST) 2013  
DOI
10.4028/www.scientific.net/SSP.205-206.260
Language
English
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Keyword(s)
  • DLTS

  • platinum

  • hydrogen

  • silicon

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