Efficient integral equation characterization of substrate integrated waveguide components

Substrate integrated waveguide (SIW) components are of high interest especially for applications in the mm-wave region. Typically these structures are simulated with FEM or FDTD tools which is cumbersome e.g. due to the discretization of the substrate layers. In this contribution, an integral equation method for multilayered media is used together with a very efficient via modeling for the characterization of such structures.