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  4. Electron tomography of nanostructured materials - Towards a quantitative 3D analysis with nanometer resolution
 
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2010
Conference Paper
Title

Electron tomography of nanostructured materials - Towards a quantitative 3D analysis with nanometer resolution

Abstract
Electron tomography has developed into a powerful technique to image the 3D structure of complex materials with nanometer resolution. Both, TEM and HAADF-STEM tomography exhibit tremendous possibilities to visualize nanostructured materials for a wide range of applications. Electron tomography is not only a qualitative tool to visualize nanostructures, but recently electron tomographic results are also exploited to obtain quantitative measurements in 3D. We evaluated the reconstruction and segmentation process for a heterogeneous catalyst and, in particular, tried to assess the reliability and accuracy of the quantification process. Furthermore, a quantitative analysis of electron tomographic results was compared to macroscopic measurements.
Author(s)
Kübel, C.
Niemeyer, D.
Cieslinski, R.
Rozeveld, S.
Mainwork
THERMEC 2009, 6th International Conference on Processing & Manufacturing of Advanced Materials. Pt.1  
Conference
International Conference on Processing & Manufacturing of Advanced Materials (THERMEC) 2009  
DOI
10.4028/www.scientific.net/MSF.638-642.2517
Language
English
Fraunhofer-Institut für Fertigungstechnik und Angewandte Materialforschung IFAM  
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