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  4. Lateral distribution of the degradation of encapsulants after different damp-heat exposure times investigated by Raman spectroscopy
 
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2010
Conference Paper
Title

Lateral distribution of the degradation of encapsulants after different damp-heat exposure times investigated by Raman spectroscopy

Abstract
PV modules have to have a service lifetime of more than 20 years. It is hard to follow suitable degradation indicators during service life testing with sufficient accuracy for reliable service life estimation. Often the polymeric encapsulation material, mostly ethylene vinyl acetate, shows degradation effects. The detection of small changes of the material in a non-destructive manner helps to follow the changes over time during indoor testing. PV modules with crystalline Si-cells of seven German manufacturers were analyzed after accelerated ageing tests with Raman spectroscopy. This technology allows non-destructive measurements of the encapsulation material through the glazing so that the degradation of the samples can be followed by measuring after different exposure times. Samples had been exposed to damp-heat conditions for up to 4000 h. The results show significant differences in the materials degradation above the edges and the center of the cell. With increasing exposure times, it becomes apparent that the degradation process starts near the edges of the cells and propagates towards the center, indicating the impact of diffusion processes.
Author(s)
Peike, C.
Kaltenbach, Thomas.
Köhl, Michael
Weiß, Karl-Anders  
Mainwork
Reliability of photovoltaic cells, modules, components, and systems III  
Conference
Reliability of Photovoltaic Cells, Modules, Components, and Systems Conference 2010  
Solar Energy and Technology Symposium 2010  
DOI
10.1117/12.860590
Language
English
Fraunhofer-Institut für Solare Energiesysteme ISE  
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