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  4. Single side polish etching for the rear side of crystalline silicon wafers
 
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2010
Conference Paper
Title

Single side polish etching for the rear side of crystalline silicon wafers

Abstract
Standard silicon solar cells have a textured front and rear side. In order to optimize the light trapping within the cell and the conditions for a good rear side passivation with local contacts, a planar rear surface is most suitable. The different structured front and rear surfaces of the wafer make the implementation of a single side etching process step essential. The main focus in this study is etching a planar rear surface with industrial standard applications based on a textured surface. With isotropic etch behaviour and high etch rates, which are preferred for inline processes, acidic measures are used to flatten the rear surface of the wafer. Mono- and multicrystalline wafers have been etched by obtaining a weighted reflection of about 35%. A successful single side polish etching after texturization requires a high silicon removal (10 to 30 µm). This process was already successfully transferred to an industrially deployable highly efficient cell design.
Author(s)
Kästner, Gero
Zimmer, Martin  
Birmann, Katrin
Souren, F.M.M.
Rentsch, Jochen  
Preu, Ralf  
Mainwork
25th European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC 2010. Proceedings  
Conference
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) 2010  
World Conference on Photovoltaic Energy Conversion 2010  
DOI
10.24406/publica-r-368688
10.4229/25thEUPVSEC2010-2CV.2.95
File(s)
001.pdf (341.52 KB)
Language
English
Fraunhofer-Institut für Solare Energiesysteme ISE  
Keyword(s)
  • PV Produktionstechnologie und Qualitätssicherung

  • Silicium-Photovoltaik

  • Messtechnik und Produktionskontrolle

  • Produktionsanlagen und Prozessentwicklung

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