Darmstadt, Germany, September 22-24, 2010; proceedings
Abstract
The technical program covered all aspects of pattern recognition and, to name only a few areas, ranged from 3D reconstruction, to object recognition and medical applications.
Beteiligt
Goesele, M.
Roth, S.
Kuijper, A.
Schiele, B.
Schindler, K.
Organisation
Deutsche Arbeitsgemeinschaft für Mustererkennung -DAGM-
