2009
Poster
Title

Comparative study between conventional macroscopic IV techniques and advanced AFM based methods for electrical characterization of dielectrics at the nanoscale

Title Supplement
Poster at 16th biannual conference of Insulating Films on Semiconductors (INFOS 2009), 29.06.-01.07.2009, Cambridge University, UK
Author(s)
Yanev, V.
Erlbacher, T.  
Rommel, Mathias  orcid-logo
Bauer, A.J.
Frey, L.
Conference
DOI
File(s)
Rights
Under Copyright
Language
English
Keyword(s)