2008
Conference Paper
Title

Material Scanner in the Submillimeter-Wave Region: Configuration and Signal Processing

Abstract
The characterization of materials in the millimeter wave frequency range offer many new applications for quality control and security applications. This paper shows results for different applications with a real aperture scanning system in the frequency range between 75 GHz - 325 GHz in amplitude and phase.
Author(s)
Krebs, C.
Schneider, S.
Hommes, A.
Nüßler, D.
Mainwork
Conference
Language
English