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Investigation of InxGa1-xN islands with electron microscopy
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2005
Conference Paper
Title
Investigation of InxGa1-xN islands with electron microscopy
Author(s)
Pretorius, A.
Yamaguchi, T.
Schowalter, M.
Kröger, R.
Kübel, C.
Hommel, D.
Rosenauer, A.
Mainwork
Microscopy of semiconducting materials
Conference
Conference on Microscopy of Semiconducting Materials (MSM) 2005
DOI
10.1007/3-540-31915-8_3
Language
English
Fraunhofer-Institut für Fertigungstechnik und Angewandte Materialforschung IFAM