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  4. Investigation of InxGa1-xN islands with electron microscopy
 
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2005
Conference Paper
Title

Investigation of InxGa1-xN islands with electron microscopy

Author(s)
Pretorius, A.
Yamaguchi, T.
Schowalter, M.
Kröger, R.
Kübel, C.
Hommel, D.
Rosenauer, A.
Mainwork
Microscopy of semiconducting materials  
Conference
Conference on Microscopy of Semiconducting Materials (MSM) 2005  
DOI
10.1007/3-540-31915-8_3
Language
English
Fraunhofer-Institut für Fertigungstechnik und Angewandte Materialforschung IFAM  
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