• English
  • Deutsch
  • Log In
    Password Login
    Have you forgotten your password?
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Konferenzschrift
  4. Strength and reliability properties of glass frit bondet micro packages
 
  • Details
  • Full
Options
2004
Conference Paper
Title

Strength and reliability properties of glass frit bondet micro packages

Abstract
The hermetic package is one crucial element to ensure high reliability and lifetime of micro mechanical sensors in automotive applications. In a proactive approach fundamental reliability limiting effects are investigated. The bond quality of aged samples is characterised by Weibull analysis of tensile tested samples. By FE analysis the three dimensional stress distribution in the bond frame during tensile testing is evaluatet using the maximum principal stresses determined by experimentally obtained fracture forces. The Micro-Chevron-Test is applied for the first time to samples containing an intermediate glass frit layer. A meande ring crack path is observed and the fracture toughness is determined.
Author(s)
Glien, K.
Graf, J.
Müller-Fiedler, R.
Höfer, H.
Ebert, M.
Bagdahn, J.
Mainwork
Design, Test, Integration and Packaging of MEMS / MOEMS. DTIP 2004. Proceedings  
Conference
Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP) 2004  
Language
English
Fraunhofer-Institut für Werkstoffmechanik IWM  
Keyword(s)
  • MEMS

  • glass frit

  • Mikrosystem

  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024