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  4. Merging Atomistic and Continuum Simulations of Silicon Technology - The Best from the Two Worlds
 
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2003
Conference Paper
Title

Merging Atomistic and Continuum Simulations of Silicon Technology - The Best from the Two Worlds

Other Title
Kombinieren von atomistischer und Kontinuumssiumlation in der Siliciumtechnologie - Das Beste der zwei Welten
Abstract
Simulation of diffusion processes during front-end silicon process steps needs to address a variety of highly complicated phenomena. In industrial environments, such simulations are nearly entirely based on continuum approaches. The physics entering into the models, on the other hand, is based on atomistic concepts and benefits considerably from the atomistic simulation capabilities developed until now. The goal of the paper is to highlight the interplay of the methods as well as their specific advantages and limitations.
Author(s)
Pichler, P.  orcid-logo
Mainwork
Nanotech 2003. Technical proceedings. Vol.2  
Conference
Nanotechnology Conference and Trade Show (Nanotech) 2003  
Language
English
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Keyword(s)
  • Prozeßsimulation

  • Kontinuumsimulation

  • atomistische Simulation

  • silicium

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