Internet-based testability driven test generation in virtual environment MOSCITO
The paper describes an environment for an Internetbased co-operation in the field of design and test of digital systems. A VLSI design flow is combined with an Internet-based hierarchical automated test pattern generation (ATPG). A novel hierarchical ATPG driven by testability measures is presented. Both, the register-transfer (RT) and the gate level descriptions are used, and decision diagrams are exploited as a uniform model for describing systems at both levels, for calculating testability measures and for test generation. The ATPG and testability analyzer can be run at geographically different places under the virtual environment MOSCITO. The interfaces between the integrated tools and also the commercial design tools were developed and implemented. The functionality of the integrated design and test system was verified in several co-operative experiments over Internet by partners in different geographical sites. The experimental results have shown the advantages of using structural tests generated by ATPG compared to using functional test sequences created by designers.