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1996
Conference Paper
Title
Material characterisation of SrS:Ce,Mn,Cl films
Abstract
Various thin film material characterisation methods are employed to analyse evaporated SrS:Ce,Mn,Cl EL phosphors. Besides the standard techniques like XRD and SEM for crystallinity and morphology inspection the doping and codoping properties are determined by RBS, EPR and SIMS investigations. In particular, the correlation between EPR and RBS data is suited for the evaluation of the Ce doping process. At the optimum Ce-doping concentration for EL operation of 0.1 mol.%, the Ce atoms are entirely incorporated as Ce3+ ions at Sr lattice sites in the SrS host. Introducing codopants like Mn cations the optimum Ce concentration could be increased. However, the incorporation of codopants is accompanied by the formation of local distortions of the octahedral vicinity of Ce3+ indicated by a shift of the g-value in the EPR signals. The stoichiometry as well as the Cl concentration are evaluated using the RBS and SIMS techniques. The Cl incorporation, which cannot be avoided if CeCl3 is taken as a precursor, is shown to depend on the substrate temperature.
Language
English
Keyword(s)
cerium
chlorine
crystal morphology
manganese
paramagnetic resonance
phosphors
rutherford backscattering
secondary ion mass spectra
stoichiometry
strontium compounds
thin films
x-ray diffraction
el phosphors
xrd
sem
crystallinity
morphology
doping properties
codoping properties
rbs
epr
sims
local distortions
g-value
substrate temperature
cecl3 precursor