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1991
Conference Paper
Title
Laser properties of 1.35 mu m InGaAs/InGaAsP-separate-confinement-multi-quantum-well-structures
Abstract
Measurements of the threshold current densities of 1.35 mu m InGaAs/InGaAsP MQW separate-confinement laser structures are presented. It is shown that the lowest values for the threshold current density can be obtained with barrier thicknesses between 10 and 15 nm. The extrapolated threshold current densities of the investigated structures varied between 780 and 1120 A-cm-2. depending on the number of wells. The characteristic temperature T0 of the laser structures was about 60 K.
Keyword(s)
gallium arsenide
gallium compounds
iii-v semiconductors
indium compounds
semiconductor junction lasers
laser properties
ridge-waveguide lasers
separate-confinement-multi-quantum-well-structures
threshold current densities
characteristic temperature
laser structures
1.35 micron
60 k
InP substrates
InGaAs-InGaAsp-InP structures