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  4. A novel npn InGaAs bipolar transistor with a wide gap cadmium oxide (CdO) emitter
 
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1985
Conference Paper
Title

A novel npn InGaAs bipolar transistor with a wide gap cadmium oxide (CdO) emitter

Abstract
A CdO film was deposited on an InGaAs pn junction to form an npn bipolar transistor, which can be used also as a phototransistor. The high conductivity of CdO ( sigma =5*103/ Omega cm) reduces the emitter contact resistance and what a refractive index of n equivalent to 2.2 at 1.15 mu m wavelength the transparent film can serve as an antireflective window. The processing of the transistor is described. A current gain of hfe=10 (VCE=3V, Ic=1mA) and an emitter-collector breakdown voltage of VCEO=6V were obtained.
Author(s)
Su, L.M.
Grote, N.
Bach, H.G.
Doldissen, W.
Rosenzweig, M.
Mainwork
Gallium Arsenide and related compounds  
Conference
International Symposium on Gallium Arsenide and Related Compounds 1984  
Language
English
Fraunhofer-Institut für Nachrichtentechnik, Heinrich-Hertz-Institut HHI  
Keyword(s)
  • bipolar transistors

  • cadmium compounds

  • gallium arsenide

  • iii-v semiconductors

  • indium compounds

  • phototransistors

  • semiconductor

  • wide gap CdO film emitter

  • npn InGaAs bipolar transistor

  • phototransistor

  • emitter contact resistance

  • refractive index

  • antireflective window

  • current gain

  • emitter-collector breakdown voltage

  • hfe-ic characteristic

  • dark current

  • i-v characteristic

  • spectral responses

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