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  4. Verfahren zur zerstörungsfreien quantitativen Bestimmung der Mikroeigenspannung II. und/oder III. Art
 
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Patent
Title

Verfahren zur zerstörungsfreien quantitativen Bestimmung der Mikroeigenspannung II. und/oder III. Art

Other Title
Method for non-destructive quantitative determination of the micro-tension II and/or III Type
Abstract
The method involves performing removal of the specimen to exclusive formation of coherent copper precipitates. The load voltage value is determined. The load voltage is dependence of the maximum Barkhausen noise amplitude for a test piece and a maximum cooling. The withdrawal of the specimen to the Ostwald ripening is performed. The load voltage value is determined. The load voltage is dependence of the maximum Barkhausen noise amplitude for a test piece after the removal to Ostwald ripening and cooling. The micro residual stress of the specimen is determined.
Inventor(s)
Altpeter, Iris
Rabung, Madalina  
Szielasko, K.
Schmauder, S.
Binkele, P.
Link to Espacenet
http://worldwide.espacenet.com/publicationDetails/biblio?DB=worldwide.espacenet.com&locale=en_EP&FT=D&CC=DE&NR=102012007062A1
Patent Number
102012007062
Publication Date
2012
Language
German
Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP  
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