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Title

Vorrichtung und Verfahren zur winkelaufgelösten Streulichmessung

Date Issued
2012
Author(s)
Trost, Marcus
Schröder, Sven
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF
Hauptvogel, Matthias
Nothni, G.
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF
Duparré, Angela
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF
Feigl, T.
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF
Patent No
102012005417
Abstract
The device has an illumination device to illuminate a sample (1) with light under an incident angle. A detector assembly detects two portions of light strewn having different light frequencies at sample. An evaluation unit evaluates output signals of detector assembly. The values for a power spectral density (PSD) are determined to analyze the scattered components and parameters for the connection of fractal spectral power density. An independent claim is included for an angle-dissolved scattered light measurement method.
Language
Deutsch
Institute
IOF
Link
http://worldwide.espacenet.com/publicationDetails/biblio?DB=worldwide.espacenet.com&locale=en_EP&FT=D&CC=DE&NR=102012005417A1
Patenprio
DE 102012005417 A1: 20120314
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