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  4. Vorrichtung und Verfahren zur Detektion von Schimmelpilzbefall auf einer Oberflaeche
 
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Patent
Title

Vorrichtung und Verfahren zur Detektion von Schimmelpilzbefall auf einer Oberflaeche

Other Title
Device for detecting fungal contamination of surfaces, useful for determining air quality in buildings, comprises culture medium close to the surface, fitted with optical sensors.
Abstract
Beschrieben wird eine Vorrichtung und ein Verfahren von Schimmelpilzbefall auf einer Oberflaeche mit einem auf oder nahe der Oberflaeche befindlichen Naehrboden mit einem Naehrmedium, das ueber guenstigere Wachstumseigenschaften fuer einen Schimmelpilzwuchs verfuegt als die Oberflaeche, sowie mit wenigstens einer optischen Sensoreinheit, die derart relativ zum Naehrboden beabstandet angebracht ist, dass die optischen Eigenschaften des Naehrbodens erfassbar sind.

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DE 10148750 A UPAB: 20030612 NOVELTY - A device for detecting contamination of a surface by fungi comprising, a growth substrate (A) placed on or near the surface, which contains: (a) a nutrient medium that provides better growth conditions for fungi than the test surface; and (b) at least one optical sensor unit that is positioned so that is can read the optical properties of the medium, is new. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is also included for detecting fungal contamination of a surface comprising: (i) placing (A) on or near the surface; (ii) detecting optical scattering properties of (A); (iii) comparing the measured properties with reference data; and (iv) generating a signal if the comparison reaches a predetermined decision value. USE - The device is used to detect contamination (or risk of contamination) by fungi, especially for quality control of air in buildings e.g. to detect fungal spores on damp surfaces. ADVANTAGE - The device allows the simple, relatively rapid (24-72 hours) and inexpensive detection of fungi, and since it is small it can be used in regions of walls and roofs that are difficult to access. It can provide continuous monitoring, allowing counter measures to be taken even if very few fungal spores are detected, and contamination can be detected directly, in situ. The device is significantly less liable to cross-contamination e.g. by bacteria, then known media.
Inventor(s)
Heilmann, A.
Schwarz, D.
Kiesow, A.
Teuscher, N.
Link to Espacenet
http://worldwide.espacenet.com/publicationDetails/biblio?DB=worldwide.espacenet.com&locale=en_EP&FT=D&CC=DE&NR=10148750A
Patent Number
2001-10148750
Publication Date
2003
Language
German
Fraunhofer-Institut für Werkstoffmechanik IWM  
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