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  4. Verfahren zum Pruefen asphaerisch gekruemmter Oberflaechen und Interferometer-Anordnung hierfuer
 
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Patent
Title

Verfahren zum Pruefen asphaerisch gekruemmter Oberflaechen und Interferometer-Anordnung hierfuer

Other Title
Process for testing aspherical curved surfaces and interferometer setup for this purpose
Abstract
The invention relates to a process for testing aspherical curved surfaces, in particular of optical components, by means of an interferometer, said invention having a wave front produced by a light source defracted by a hologram and converted into a test wave; after passing through a beam splitter, the test wave is reflected as a measuring wave at least partially from the aspherical curved surface of a unit under test arranged in the measuring arm and is reflected as a reference wave from a mirror arranged in the reference arm, and an interferogram is produced in an observation level by the measuring and reference waves reflected by superimposition. The main features of the invention include the fact that a hologram representing the reference shape of the entire surface of the unit under test is generated and that the reference wave is provided by reflection of the same from a phase-conjugated mirror. The invention also refers to an interferometer setup to perform the process described above.
Inventor(s)
Notni, G.
Kowarschik, R.
Wenke, L.
Link to Espacenet
http://worldwide.espacenet.com/publicationDetails/biblio?DB=worldwide.espacenet.com&locale=en_EP&FT=D&CC=DE&NR=4242882A
Patent Number
1992-4242882
Publication Date
1996
Language
German
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
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