English
Deutsch
Log In
Log in with Fraunhofer Smartcard
Password Login
Research Outputs
Fundings & Projects
Researchers
Institutes
Statistics
Fraunhofer-Gesellschaft
Home
Fraunhofer-Gesellschaft
Buch
Mixed level test generation for synchronous sequential circuits using the FOGBUSTER-algorithm
Details
Full
Export
Statistics
Options
Show all metadata (technical view)
1994
Report
Title
Mixed level test generation for synchronous sequential circuits using the FOGBUSTER-algorithm
Author(s)
Gläser, U.
Publisher
GMD Forschungszentrum Informationstechnik
Publishing Place
Sankt Augustin
Language
English
AIS