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Reliability characteristics of vertical pin diodes on Si and GaN substrates for high-power applications
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2020
Master Thesis
Title
Reliability characteristics of vertical pin diodes on Si and GaN substrates for high-power applications
Thesis Note
Freiburg/Brsg., Univ., Master Thesis, 2020
Author(s)
Gupta, Rohit
Fraunhofer-Institut für Angewandte Festkörperphysik IAF
Advisor(s)
Ambacher, Oliver
Fraunhofer-Institut für Angewandte Festkörperphysik IAF
Quay, Rüdiger
Fraunhofer-Institut für Angewandte Festkörperphysik IAF
Driad, Rachid
Fraunhofer-Institut für Angewandte Festkörperphysik IAF
Publishing Place
Freiburg/Brsg.
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF