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  4. Scanner-based direct laser interference patterning on stainless steel
 
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2021
Journal Article
Titel

Scanner-based direct laser interference patterning on stainless steel

Abstract
Direct laser interference patterning (DLIP) so far has been used almost exclusively in combination with mechanical translation stages reaching impressive throughputs for very specific configurations. As an alternative, DLIP modules can be combined with laser scanners, however presenting some limitations in comparison with standard static optical setups due to the limited possible spatial separation between the interfering beams. Herein, the fabrication of periodic microstructures on stainless steel using a galvanometer‐scanner DLIP approach is addressed. Line‐like patterns with spatial periods ranging from 2.9 to 12.8 mm are produced using a nanosecond pulsed laser source operating at a wavelength of 527 nm. The scan fields generated are evaluated with respect to the structure quality and scan field size, with dependence on the spatial period. Furthermore, the correlation between the spatial period, laser fluence, total number of pulses, and resulting structure depth of the line‐like patterns is discussed. In addition, the optimization of process parameters leads to surface patterns with aspect ratios greater than 1. The achievable structuring speeds are determined under consideration of the used number of pulses. Finally, throughputs up to 7.69 cm2 min−1 with less than 0.5 W laser power at a repetition rate of 3.5 kHz are realized.
Author(s)
Madelung, Aleksander
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS
Alamri, Sabri
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS
Steege, Tobias
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS
Krupop, Benjamin
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS
Lasagni, Andrés-Fabián
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS
Kunze, Tim
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS
Zeitschrift
Advanced engineering materials
Project(s)
SHARK
Funder
European Commission EC
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DOI
10.1002/adem.202001414
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Externer Link
Language
English
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Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS
Tags
  • direct laser interference patterning

  • nanosecond laser pulses

  • line-like patterns

  • high-throughput screening

  • galvanometer scanners

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