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  4. Quasi-bound states in the continuum for deep subwavelength structural information retrieval for DUV nano-optical polarizers
 
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2020
Journal Article
Title

Quasi-bound states in the continuum for deep subwavelength structural information retrieval for DUV nano-optical polarizers

Abstract
We demonstrate the retrieval of deep subwavelength structural information in nano-optical polarizers by scatterometry of quasi-bound states in the continuum (quasi-BICs). To this end, we investigate titanium dioxide wire grid polarizers for application wavelengths in the deep ultraviolet (DUV) spectral range fabricated with a self-aligned double-patterning process. In contrast to the time-consuming and elaborate measurement techniques like scanning electron microscopy, asymmetry induced quasi-BICs occurring in the near ultraviolet and visible spectral range provide an easily accessible and efficient probe mechanism. Thereby, dimensional parameters are retrieved with uncertainties in the sub-nanometer range. Our results show that BICs are a promising tool for process control in optics and semiconductor technology.
Author(s)
Siefke, T.
Rojas Hurtado, C.B.
Dickmann, J.
Dickmann, W.
Käseberg, T.
Meyer, J.
Burger, S.
Zeitner, U.
Bodermann, B.
Kroker, S.
Journal
Optics Express  
Open Access
DOI
10.1364/OE.396044
Additional link
Full text
Language
English
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Keyword(s)
  • deep ultraviolet

  • scanning electron microscopy

  • semiconductor device manufacture

  • structural information

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