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  4. Avoiding Voltage-Induced Degradation in PET-ITO-Based Flexible Electrochromic Devices
 
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2020
Journal Article
Title

Avoiding Voltage-Induced Degradation in PET-ITO-Based Flexible Electrochromic Devices

Abstract
The cycling stability of flexible electrochromic devices (ECDs) under humid atmospheres is limited by irreversible indium tin oxide (ITO) reduction. A strategy to limit this degradation was developed and tested for model ECDs based on a sidechain-modified poly(3,4-ethylene dioxythiophene) (PEDOT) derivative and Prussian blue (PB). This work reveals that the cycling stability is reduced by dissolution of the ITO thin films and formation of metallic indium particles on the surface of the ITO layers. The ITO degradation strongly depends on the applied electrode potentials in combination with moisture ingress into the ECDs. To avoid ITO reduction in ECDs, efforts were made to adjust the electrode potentials. ECDs equipped with an auxiliary reference electrode were set up to gather knowledge on the actual electrode potentials. By adjusting the electrode charge density ratio, it was possible to narrow the overall cell voltage window to an extent in which irreversible ITO reduction no longer occurs. Detailed investigation of ECDs with the optimized cell configuration (charge density ratio) showed that the overall device performance with regard to visible light transmittance change and response time is not impaired and that the cycling stability under humid atmosphere (90% rH) is dramatically improved. Thus, the proposed strategy offers an excellent perspective for the commercialization of flexible ECDs upon their enhanced durability.
Author(s)
Macher, Sven  
Fraunhofer-Institut für Silicatforschung ISC  
Rumpel, Matthias  
Fraunhofer-Institut für Silicatforschung ISC  
Schott, Marco  
Fraunhofer-Institut für Silicatforschung ISC  
Posset, Uwe  
Fraunhofer-Institut für Silicatforschung ISC  
Giffin, Guinevere A.
Fraunhofer-Institut für Silicatforschung ISC  
Löbmann, Peer  
Fraunhofer-Institut für Silicatforschung ISC  
Journal
ACS applied materials & interfaces  
DOI
10.1021/acsami.0c07860
Language
English
Fraunhofer-Institut für Silicatforschung ISC  
Keyword(s)
  • electrochromism

  • electrochromic device

  • durability

  • PET-ITO

  • indium tin oxide

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