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  4. Nanocutting mechanism of 6H-SiC investigated by scanning electron microscope online observation and stress-assisted and ion implant-assisted approaches
 
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2020
Journal Article
Title

Nanocutting mechanism of 6H-SiC investigated by scanning electron microscope online observation and stress-assisted and ion implant-assisted approaches

Abstract
Nanocutting mechanism of single crystal 6H-SiC is investigated through a novel scanning electron microscope setup in this paper. Various undeformed chip thicknesses on (0001) < 1â100 > orientation are adopted in the nanocutting experiments. Phase transformation and dislocation activities involved in the 6H-SiC nanocutting process are also characterized and analyzed. Two methods of stress-assisted and ion implant-assisted nanocutting are studied to improve 6H-SiC ductile machining ability. Results show that stress-assisted method can effectively decrease the hydrostatic stress and help to activate dislocation motion and ductile machining; ion implant-induced damages are helpful to improve the ductile machining ability from MD simulation and continuous nanocutting experiments under the onl ine observation platform.
Author(s)
Xu, Zongwei
State Key Laboratory of Precision Measuring Technology &Instruments, Centre of MicroNano Manufacturing Technology,Tianjin University, Tianjin, China
Liu, Lei
State Key Laboratory of Precision Measuring Technology &Instruments, Centre of MicroNano Manufacturing Technology,Tianjin University, Tianjin, China
He, Zhongdu
State Key Laboratory of Precision Measuring Technology &Instruments, Centre of MicroNano Manufacturing Technology,Tianjin University, Tianjin, China
Tian, Dongyu
State Key Laboratory of Precision Measuring Technology &Instruments, Centre of MicroNano Manufacturing Technology,Tianjin University, Tianjin, China
Hartmaier, Alexander
Interdisciplinary Centre for Advanced Materials Simulation(ICAMS), Ruhr-University Bochum, Bochum, Germany
Zhang, Junjie
Center for Precision Engineering, Harbin Institute of Technology,Harbin, China
Luo, Xichun
Centre for Precision Manufacturing, Department of Design,Manufacture & Engineering Management, University of Strathclyde,Glasgow, UK
Rommel, Mathias  orcid-logo
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Nordlund, Kai
Department of Physics, Helsinki Institute of Physics POB 43,University of Helsinki, Helsinki, Finland
Zhang, Guoxiong
State Key Laboratory of Precision Measuring Technology &Instruments, Centre of MicroNano Manufacturing Technology,Tianjin University, Tianjin, China
Fang, Fengzhou
State Key Laboratory of Precision Measuring Technology &Instruments, Centre of MicroNano Manufacturing Technology,Tianjin University, Tianjin, China
Journal
The International Journal of Advanced Manufacturing Technology  
Funder
National Natural Science Foundation of China NSFC  
National Natural Science Foundation of China NSFC  
DOI
10.1007/s00170-019-04886-6
Language
English
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Keyword(s)
  • diamond turning

  • silicon carbide

  • phase transformation

  • surface integrity

  • MD simulation

  • ion beam machining

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