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  4. AlGaN avalanche Schottky diodes with high Al-content
 
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2019
Journal Article
Title

AlGaN avalanche Schottky diodes with high Al-content

Abstract
AlxGa1−xN-based avalanche photodiodes with a Schottky-contact grown on AlN bulk substrate with an Al-content of x = 0.68 have been examined with respect to their structural and electro-optical properties. The Schottky diodes suitable for the solar-blind ultraviolet spectral regime show avalanche gain for voltages in excess of 25 V reverse bias in linear gain mode under frontside illumination. For 60 V reverse bias, avalanche multiplication exceeding 104 was obtained. The devices were operated well below breakdown; the measured current for frontside illuminated conditions exceeds the dark-condition characteristics by more than two orders of magnitude at this voltage. The Schottky-barrier height FB and the ideality n were extracted to FB = 2.06 eV and n = 1.26 at room temperature, respectively. Temperature dependent measurements indicate a temperature insensitive dark current mechanism with an enhanced multiplication process towards lower temperatures.
Author(s)
Watschke, Lars
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Passow, Thorsten  orcid-logo
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Fuchs, Frank
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Kirste, Lutz  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Driad, Rachid  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Rutz, Frank  orcid-logo
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Leone, Stefano  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Rehm, Robert  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Ambacher, Oliver  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Journal
Japanese journal of applied physics  
Conference
International Workshop on Nitride Semiconductors (IWN) 2018  
DOI
10.7567/1347-4065/ab138f
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
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