Multilevel Testing for Embedded Systems

Multilevel testing constitutes an evolving methodology that aims at reducing the effort required for functional testing of large systems, where the test process is divided into a set of subsequent test levels. This is basically achieved by exploiting the full test reuse potential across test levels. For this purpose, we analyze the commonality shared between test levels as well as the variability and design a test reuse strategy that takes maximum advantage of the commonality while minimizing the effects of the variability. With this practice, we achieve reductions in test effort for testing system functions across test levels, which are characterized by high commonality and low variability.