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Introduction to Design, Test and Thermal Management of 3D Integrated Circuits
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2019
Aufsatz in Buch
Titel
Introduction to Design, Test and Thermal Management of 3D Integrated Circuits
Author(s)
Garrou, Philip
Microelectronics Consultants of NC
Koyanagi, Mitsumasa
Tohoku University
Ramm, Peter
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT
Hauptwerk
Handbook of 3D Integration. Design, Test, and Themal Management. Vol.4: Design, Test and Thermal Management of 3D Integrated Circuits
File(s)
N-538037.pdf (130.93 KB)
Language
Englisch
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EMFT
Tags
3D integration
3DIC
TSV
design
test
thermal management