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  4. Introduction to Design, Test and Thermal Management of 3D Integrated Circuits
 
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2019
Aufsatz in Buch
Titel

Introduction to Design, Test and Thermal Management of 3D Integrated Circuits

Author(s)
Garrou, Philip
Microelectronics Consultants of NC
Koyanagi, Mitsumasa
Tohoku University
Ramm, Peter
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT
Hauptwerk
Handbook of 3D Integration. Design, Test, and Themal Management. Vol.4: Design, Test and Thermal Management of 3D Integrated Circuits
File(s)
N-538037.pdf (130.93 KB)
Language
Englisch
google-scholar
EMFT
Tags
  • 3D integration

  • 3DIC

  • TSV

  • design

  • test

  • thermal management

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