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  4. MgF2 films prepared from solvothermally treated precursor solutions
 
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2018
Journal Article
Titel

MgF2 films prepared from solvothermally treated precursor solutions

Abstract
MgF2 coating solutions were solvothermally treated at 160 °C for different time periods, this procedure induced crystallization and particle growth. Antireflection coatings prepared on glass from these solutions were compared to films derived from untreated precursor material. Ellipsometric porosimetry (EP) was employed to characterize structural features of coatings on glass as function of annealing temperature. Based on precursor solutions that had undergone solvothermal treatment antireflective coatings with a peak transparency exceeding 99% were prepared on PMMA substrates.
Author(s)
Jahn, Rainer
Fraunhofer-Institut für Silicatforschung ISC
Löbmann, Peer
Fraunhofer-Institut für Silicatforschung ISC
Zeitschrift
Journal of Sol-Gel Science and Technology
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DOI
10.1007/s10971-018-4590-5
Language
English
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Fraunhofer-Institut für Silicatforschung ISC
Tags
  • Magnesiumfluorid

  • Dünnfilm

  • Antireflexschicht

  • Solvothermalsynthese

  • Ellipsometrie

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