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Femtosecond Laser Damage in Metals and Semiconductors During TriBeam Tomography
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2016
Journal Article
Titel
Femtosecond Laser Damage in Metals and Semiconductors During TriBeam Tomography
Author(s)
Echlin, M.P.
Titus, M.
Lenthe, W.C.
Straw, M.
Gumbsch, P.
Pollock, T.M.
Zeitschrift
Microscopy and microanalysis
DOI
10.1017/S1431927616001598
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Language
English
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Fraunhofer-Institut für Werkstoffmechanik IWM