• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Artikel
  4. Reduced threshold current dilute nitride Ga(NAsP)/GaP quantum well lasers grown by MOVPE
 
  • Details
  • Full
Options
2011
Journal Article
Title

Reduced threshold current dilute nitride Ga(NAsP)/GaP quantum well lasers grown by MOVPE

Abstract
Recent significant improvements in Ga(NAsP)/GaP quantum well lasers grown by metal organic vapour phase epitaxy on a GaP substrate are reported. At room temperature, the devices show a threshold current density of 4.0 kAcm(-2) at a lasing wavelength of 981 nm for a cavity length of 1 mm and a characteristic temperature of 58 K in the temperature region of 220-295 K. These improvements further verify the possible application for the novel III/V Ga(NAsP)/GaP material system to integrate long-term stable laser diodes in a standard CMOS-compatible electronic chip.
Author(s)
Hossain, N.
Sweeney, S.J.
Rogowsky, S.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Ostendorf, Ralf  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Wagner, J.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Liebich, S.
Zimprich, M.
Volz, K.
Kunert, B.
Stolz, W.
Journal
Electronics Letters  
Open Access
DOI
10.1049/el.2011.1927
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024