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TEM analysis of aluminum anodization layers - Cryo-EFTEM and electron tomography
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2006
Journal Article
Title
TEM analysis of aluminum anodization layers - Cryo-EFTEM and electron tomography
Author(s)
Kübel, C.
Dieckhoff, Stefan
Fraunhofer-Institut für Fertigungstechnik und Angewandte Materialforschung IFAM
Journal
Microscopy and microanalysis
DOI
10.1017/S1431927606068371
Language
English
Fraunhofer-Institut für Fertigungstechnik und Angewandte Materialforschung IFAM