English
Deutsch
Log In
Log in with Fraunhofer Smartcard
Password Login
Have you forgotten your password?
Research Outputs
Fundings & Projects
Researchers
Institutes
Statistics
Fraunhofer-Gesellschaft
Home
Fraunhofer-Gesellschaft
Artikel
Electron tomographic characterization of ErSi2 and GexSi1-x nanoparticles prepared by doping of 4H-SiC
Details
Full
Export
Statistics
Options
Show all metadata (technical view)
2006
Journal Article
Title
Electron tomographic characterization of ErSi2 and GexSi1-x nanoparticles prepared by doping of 4H-SiC
Author(s)
Kübel, C.
Kaiser, Ulrich
Journal
Microscopy and microanalysis
DOI
10.1017/S1431927606064932
Language
English
Fraunhofer-Institut für Fertigungstechnik und Angewandte Materialforschung IFAM
