2005
Journal Article
Title

Recent advances in electron tomography: TEM and HAADF-STEM tomography for materials science and semiconductor applications

Author(s)
Kübel, C.
Voigt, A.
Schoenmakers, R.
Otten, M.
Su, D.
Lee, T.-C.
Carlsson, A.
Bradley, J.
Journal
Open Access
DOI
Additional link
Language
English