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Reliability of ultra-thin N2O-nitrided oxides grown by RTP under low-pressure in different gas atmospheres
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2001
Journal Article
Title
Reliability of ultra-thin N2O-nitrided oxides grown by RTP under low-pressure in different gas atmospheres
Author(s)
Beichele, M.
Bauer, A.J.
Herden, M.
Ryssel, H.
Journal
Solid-State Electronics
DOI
10.1016/S0038-1101(01)00061-2
Language
English
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB