Options
2000
Journal Article
Title
MOMBE selective infill growth of InP/GaInAs for quantum dot formation
Abstract
Quantum dots based on InP/GaInAs quantum wells were realised using epitaxial infill regrowth into a hole array formed in InP by means of e-beam lithography and reactive ion etching. Metal organic molecular beam epitaxy has been applied for selective infill growth. The growth procedure has been elaborated such that the vertical growth rate in predefined holes agrees with coherent growth and edge effects are minimised. Quantum dots formed in holes with a diameter ranging from 60 nm down to 30 nm in combination with a periodicity of 100 nm were studied. The achievement of quantum dots was evidenced by a blue shift of light emission with decreasing the geometrical quantum dot diameter, in qualitative agreement with calculations. Quantitative discrepancies were found because the effective lateral diameter of the quantum dots proved to be smaller than the geometrical value of the etched holes, caused by the lateral growth of the lower InP barrier.
Keyword(s)
electron beam lithography
gallium arsenide
iii-v semiconductors
indium compounds
molecular beam epitaxial growth
photoluminescence
scanning electron microscopy
semiconductor epitaxial layers
semiconductor growth
semiconductor quantum dots
sputter etching
quantum dot formation
quantum wells
epitaxial infill regrowth
hole array
reactive ion etching
metalorganic molecular beam epitaxy
selective infill growth
vertical growth rate
coherent growth effects
edge effects
SEM
30 to 100 nm
InP-(gain)As