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1992
Journal Article
Title
Polycrystalline diamond for optical thin films
Other Title
Polykristalliner Diamant für optische dünne Schichten
Abstract
Polycrystalline diamond (PCD) films have been grown on silicon substrates by thermally activated (hot filament) chemical vapour deposition (CVD) and microwave plasma-assisted CVD. In addition, freestanding PCD wafers have been prepared by removing the substrate. A requirement for optical applications of these films is a relatively smooth surface, i.e. a small surface roughness as compared to the optical wavelength. A reduction of surface roughness of thin PCD films has been achieved by increasing the nucleation density to above 10(exp 10) cm(exp -2) using an appropriate substrate pretreatment. This high nucleation density allows the deposition of thin films with thicknesses between 0.1 and 0.6 mu m showing intense interference colours. By moving silicon wafers 3 in (7.6 cm) in diameter under the hot filament during the deposition process, large area diamond coatings with very uniform film thicknesses were obtained. The roughness of thick PCD films (thickness greater than 1 mu m) cou ld be reduced by enforcing secondary nucleation. However, the resulting nanocrystalline films have considerable amounts of nondiamond phases. Using microwave plasma-assisted CVD, relatively smooth PCD films with a surface consisting of (100) faces oriented parallel to the substrate were prepared. These films exhibit a pronounced 100 texture.
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