Novel simple method for determination of refractive index of optical monomode slab waveguides

A novel simple nondestructive interference method is proposed for measuring the refractive index of optical monomode slab waveguides and cladding layers of sufficient thickness. This method has been used to investigate thin films of III-V compounds on binary substrates, especially GaInAsP/InP, with respect to application for integrated optical devices in the transparent wavelength region. The experimental results are compared with theoretical calculations.