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  4. Ion beam milling of InP with an Ar/O2-gas mixture
 
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1984
Journal Article
Title

Ion beam milling of InP with an Ar/O2-gas mixture

Abstract
Ion beam etching has been successfully applied to InP using an Ar/O2-gas mixture. Varying angles of beam incidence resulted in different shapes of the etched profiles with the achievement even of undercutting. Good selectivity with respect to Novolak-type photoresists prevails at higher accelerating voltages.
Author(s)
Katzchner, W.
Steckenborn, A.
Löffler, R.
Grote, N.
Journal
Applied Physics Letters  
DOI
10.1063/1.94725
Additional link
Full text
Language
English
Fraunhofer-Institut für Nachrichtentechnik, Heinrich-Hertz-Institut HHI  
Keyword(s)
  • iii-v semiconductors

  • indium compounds

  • semiconductor technology

  • sputter etching

  • semiconductor

  • ion beam etching

  • ion beam milling

  • inp

  • ar/o2-gas mixture

  • undercutting

  • novolak-type photoresists

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